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The "A-unit" diffractometeranchor 

Optical

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Optical Microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Optical microscopeWild HeerbruggA-443Trygve L. Schanche 
Optical microscopeLeica MEF4ME-514Trygve L. Schanche   
Optical microscopeReichert-Jung UnivarE-514Trygve L. Schanche   
Optical microscopeMakroskop Leitz M400E-508Trygve L. Schanche   
Optical microscopeLeitz MM6E-508Trygve L. Schanche   
Optical microscopeZeiss Axiovert 25E-508Trygve L. Schanche  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508Trygve L. Schanche   
Optical microscopeLeitz 1AE-508Trygve L. Schanche   
Optical microscopeReichert MEF1E-508Trygve L. Schanche   
Optical microscopeLeitz Metallux 3E-514ATrygve L. Schanche  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGKII-014Trygve L. Schanche   
Videokamera til mikroskopLeica R3 elecrt.E-514ATrygve L. Schanche   
Optical microscopeLeitz AxioskopE-514ATrygve L. Schanche  Leitz Axioskop
Optical MicroscopeNikon SM2800KII-323Eli Beate Larsen 
Optical MicroscopeLeica DM IRMKII-323Eli Beate Larsen 
Optical microscopeZeissKII-003A Magnus B. Følstad 
Optical microscopeLeica DMILKII-022Trygve L. Schanche  Kara Poon 
Optical microscopeOlympus BH-2KII-032AStein Rørvik (SINTEF) 
Optical microscopeReichert MeF3A med Sony kameraKII-032AStein Rørvik (SINTEF) 
Optical microscopeOlympus BX60KII-032AStein Rørvik (SINTEF) 
Optical microscopeLeica EZ4KII-034BSergey Khromov 
Optical microscopeWild HeerbruggKII-011  
Optical microscope 3DAlicona Infinite FocusKII-032AKara Poon 

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Electron microscope
Electron microscope

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Type of equipmentName of equipmentLocationContact personLink to more information
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Link in New Window
linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf
Scanning probe microscopeAgilent 5500 AFM/SPM microscopeKII-003AMagnus B. FølstadAbout the instrument

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TEM
TEM

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 Perkin Elmer Diffential scanning calorimeter 
Type of equipmentName of equipmentLocationContact personLink to more information
Thermal analysisDTA/TGA Setaram SensisA-K032Sarina Bao (SINTEF) 
Thermal analysisElectrical conductivity furnaceKII-103Belma TalicPei Na Kui  
Thermal analysisNETZSCH dilatometer 402C, themal analysisKII-103Eli Beate LarsenBabak KhalaghiDilatometer 
Thermal analysisNETZSCH STA449 jupiter, thermal analysis 1STA F3 449 Jupiter (Hugin)KII-103Eli Beate LarsenBabak KhalaghiSimultaneous Thermal Analysis 
Thermal analysisNETZSCH STA449 jupiter, thermal analysis 2STA C 449 Jupiter, (Munin)KII-103Babak KhalaghiSimultaneous Thermal Analysis combined with mass spectrometry
Thermal analysisLINSEIS STA PT 1600, (Linseis)KII-103Eli Beate LarsenBabak KhalaghiSimultaneous Thermal Analysis
Thermal analysisNETZSCH dilatometer 402EKII-103Ove Darell (SINTEF) 
Thermal analysisNETZSCH DSC 214 Polyma KII-103Sverre Magnus SelbachBabak KhalaghiDSC 214 Polyma
Thermal analysisOptisk dilatometer-Expert systemKII-119103Anne Støre (SINTEF) 
Thermal analysisLFA Microflash, termisk diffusivitetKII-119103Anne Støre (SINTEF) 
Thermal analysisDilatometerKII-303Anne Støre (SINTEF) 

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Type of equipmentName of equipmentLocationContact personLink to more information
SpectroscopyGD-OESKII-307Mariia Stepanova 
Spectroscopy Element AnalysisGD-MSE-208Chiara Modanese 
Mass spectrometer + potensiostatDifferential Electrochemical Mass Spectrometry (DEMS) stationMassespectrometerPfeiffer Vacum Prisma Plus HiCubeKII-014323Magnus B. Følstad 
UV-vis/NIR spektrofotometer spectrophotometer + potensiostatPhotoelectrochemical stationKII-014001Magnus B. Følstad 
FTIR spectrometerBruker Vertex 80vKII-323

Johannes Ofstad

 

Raman microscopeWITec alpha300 RKII-323

Johannes Ofstad

 

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Surface and particle analysis
Surface and particle analysis

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Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysisPSA Malvern 2000KII-107Elin Albertsen 
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
Surface and particle analysisPermeabilitetKII-303Anne Støre (SINTEF)

 

Zetapotential and particle size analyzerBeckman Coulter DelsaNano CKII-223Magnus B. FølstadDescription, terms of use & user manual
Surface analyzerDrop Shape Analyzer - DSA100KII-321Anita StorsveDescription
Laser scattering particle size analyzerHoriba LA-960 ParticaKII-107Eva RiseDescription
Micro Scratch TesterST Instruments B AKII-321Anita Storsve 

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XRD
XRD

XRD

Info

More information about the XRD lab


D8 Advance BrukerThe "D8 Advance"Da Vinci 1 BrukerDa Vinci 2 BrukerThe "DaVinci 2"A-unit SiemensThe "A-unit"D8 Focus BrukerThe "D8 Focus"
Type of equipmentName of equipmentLocationContact personLink to more information
XRDRoutine Powder Diffractometer (DaVinci1)KII-113Kristin HøydalsvikContact personRoutine powder XRD
XRDPowder diffractometer (D8 Focus)KII-113Kristin HøydalsvikThe "DaVinci 1"XRDContact person9-pos Powder XRD
XRDSiemens D5005 with monochromator (A-unit)KII-113Kristin HøydalsvikContact personSiemens D5005
XRDMultipurpose Powder X-ray diffractometer (DaVinci2)KII-113Kristin HøydalsvikContact personMultipurpose XRD
XRDNon-ambient X-ray diffractometer (D8 Advance)KII-113Kristin HøydalsvikContact personNon-ambient XRD
Texture AnalysisX-ray diffractometerA-347Torild KrogstadHåkon Wiik ÅnesXRD

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Solar cell silicon characterisation
Solar cell silicon characterisation

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