Optical Microscope
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| Electron microscope |
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| Electron microscope |
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Electron microscope
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu | Link in New Window |
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linkText | Hitachi SU6600 FEG SEM |
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href | http://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg |
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Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu | |
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| Fe-sem (Zeiss Ultra 55 LE) |
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| href | http://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf |
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Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu | Link in New Window |
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linkText | SEM A (JSM 840) |
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href | http://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf |
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Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu | |
Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu | Link in New Window |
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linkText | EDS, EDAX Gernesis |
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href | http://edax.com/ |
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Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu | Link in New Window |
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linkText | LV-Fe-SEM (ZeissSupra 55 VP) |
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href | http://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf |
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Scanning electron microscopy | Hitachi S-3400N | KII-036 | Sergey Khromov | |
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| Scanning probe microscope |
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| Scanning probe microscope |
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Scanning probe microscope
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes | Link in New Window |
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linkText | JEOL JXA-8500F Electron Probe Micro analyzer (EPMA) |
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href | http://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf |
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Scanning probe microscope | Agilent 5500 AFM/SPM microscope | KII-003A | Magnus B. Følstad | About the instrument |
Transmission electron microscopy
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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TEM with Gatan GIF system | JEOL TEM 2010 | F-368 | Yingda Yu | |
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| Thermal analysis |
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| Thermal analysis |
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Thermal analysis
Electron microscope
Optical microscope
Scanning probe microscope
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Spectroscopy
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Spectroscopy | GD- |
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Mass spectrometer + potensiostat | Differential Electrochemical Mass Spectrometry (DEMS) station | KII-323 | Magnus B. Følstad | |
UV-vis/NIR spectrophotometer + potensiostat | Photoelectrochemical station | KII-001 | Magnus B. Følstad | |
FTIR spectrometer | Bruker Vertex 80v | KII-323 | | |
Raman microscope | WITec alpha300 R | KII-323 | | |
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| Surface and particle analysis |
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| Surface and particle analysis |
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Surface and particle analysis
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Surface and particle analysis | 3Flex 3500 | KII-107 | Elin Albertsen | BET |
Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET |
Surface and particle analysis | Permeabilitet | KII-303 | Anne Støre (SINTEF) | |
Zetapotential and particle size analyzer | Beckman Coulter DelsaNano C | KII-223 | Magnus B. Følstad | Description, terms of use & user manual |
Surface analyzer | Drop Shape Analyzer - DSA100 | KII-321 | Anita Storsve | Description |
Laser scattering particle size analyzer | Horiba LA-960 Partica | KII-107 | Eva Rise | Description |
Micro Scratch Tester | ST Instruments B A | KII-321 | Anita Storsve | |
XRD
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Torild Krogstad / 918 97 623
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| Solar cell silicon characterisation |
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| Solar cell silicon characterisation |
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Solar cell silicon characterisation
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Si - Characterisation | Nicolet 6700 FT-IR | M-104 | Chiara Modanese | |
Si - Characterisation | µLPCD resistivty life time measurment | M-104 | Gaute Stokkan (SINTEF) | |
Si - Characterisation | SiWaScan | M-104 | Gaute Stokkan (SINTEF) | |
Si - Characterisation | micro cracks characterisation | M-104 | Kai Erik Ekstrøm | |
Si - Characterisation Crystal deffect mesurment | PVSCAN 6000 | M-104 | Gaute Stokkan (SINTEF) | |
Si - Characterisation Density Imaging | CDI-Carrier | M-104 | Gaute Stokkan (SINTEF) | |
Electrical resistivity measurement
Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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Resistivity measurement (metals) | Sigmascope | E-508 | Trygve L. Schanche | |
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