Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||||||
---|---|---|---|---|---|---|---|---|---|---|
Element Analysis | GD-MS | E-208 | Chiara Modanese | |||||||
Surface and particle analysis | XRD Texture AnalysisX-ray diffractometer | A-347 | Torild Krogstad | |||||||
Optical microscope | Wild Heerbrugg | A-443 | Trygve L. Schanche | |||||||
Optical microscope | Leica MEF4M | E-514 | Trygve L. Schanche | |||||||
Optical microscope | Reichert-Jung Univar | E-514 | Trygve L. Schanche | |||||||
Optical microscope | Makroskop Leitz M400 | E-508 | Trygve L. Schanche | |||||||
Optical microscope | Leitz MM6 | E-508 | Trygve L. Schanche | |||||||
Optical microscope | Zeiss Axiovert 25 | E-508 | Trygve L. Schanche | Zeiss Axiovert 25 | ||||||
Optical microscope | Leitz metalloplan | E-508 | Trygve L. Schanche | |||||||
Optical microscope | Leitz 1A | E-508 | Trygve L. Schanche | |||||||
Optical microscope | Reichert MEF1 | E-508 | Trygve L. Schanche | |||||||
Optical microscope | Leitz Metallux 3 | E-514A | Trygve L. Schanche | Leitz Metallux 3 | ||||||
Videokamera (2 stk) | JVC TK-S310 EG | E-514A | Trygve L. Schanche | |||||||
Videokamera til mikroskop | Leica R3 elecrt. | E-514A | Trygve L. Schanche | |||||||
Optical microscope | Leitz Axioskop | E-514A | Trygve L. Schanche | Leitz Axioskop | ||||||
Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Hitachi SU6600 | F-362 | Yingda Yu |
| ||||||
Scanning Electron Microscopy | FE-SEM with Bruker EDS/NORDIF EBSD system Zeiss Ultra 55 | F-362 | Yingda Yu |
| ||||||
Scanning Electron Microscopy | SEM with Nordif EBSD system JEOL JSM 840A | F-362 | Yingda Yu |
| ||||||
Transmission Electron Microscopy | TEM with Gatan GIF system JEOL TEM 2010 | F-368 | Yingda Yu |
| ||||||
Scanning Electron Microscopy | SEM with Gatan CL system JEOL JSM 840 | F-369 | Yingda Yu | |||||||
Scanning Electron Microscopy | SEM with JEOL EDS system JEOL JSM 6010LA | F-369 | Yingda Yu |
| ||||||
Scanning Electron Microscopy | FE-SEM wirh EDAX EDS system Zeiss Supra 55VP | F-369 | Yingda Yu |
| ||||||
Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes |
| ||||||
Scanning probe microscope | AFM/STM Agilent 5500 | KII-003A | Magnus Følstad |
| ||||||
UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | KII-014 | Magnus Følstad |
| ||||||
Thermal analysis | Perkin Elmer Diffential scanning calorimeter | KII-103 | Sverre Magnus Selback | ovn | ||||||
Thermal analysis | High temperature oxygen flux furnace | KII-103 | Belma Talic | |||||||
Thermal analysis | NETZSCH dilatometer 402E | KII-103 | Ove Darell | |||||||
Thermal analysis | NETZSCH dilatometer 402C | KII-103 | Eli Beate Larsen | |||||||
Thermal analysis | NETZSCH STA449 jupiter | KII-103 | Eli Beate Larsen | |||||||
Thermal analysis | NETZSCH STA449 jupiter | KII-103 | Eli Beate Larsen | ovn | ||||||
Thermal analysis | Electrical conductivity furnace | KII-103 | Belma Talic | |||||||
Nitrogentank | KII-107 | Elin Albertsen | ||||||||
Surface and particle analysis | PSA Malvern 2000 | KII-107 | Jannicke Kvello | |||||||
Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin Albertsen | BET | ||||||
LECO | Oxygen and nitrogen analysis | LECO, oksygen og nitrogenanalysator | KII-107 | Anne Støre | ||||||
Pycnometer | Accupyc 1330 Pycnometer | KII-107 | Julian Tolchard | |||||||
XRD | D8 advance Bruker | KII-113 | Julian Tolchard | |||||||
XRD | Da Vinci 1 Bruker | KII-113 | Julian Tolchard | |||||||
XRD | Da Vinci 2 Bruker | KII-113 | Julian Tolchard | |||||||
XRD | A-unit X-ray diffractometer | KII-113 | Julian Tolchard | |||||||
XRD | D8 focus Siemens | KII-113 | Julian Tolchard | |||||||
Thermal analysis | Optisk dilatometer-Expert system | KII-119 | Anne Støre | |||||||
Thermal analysis | LFA Microflash, termisk diffusivitet | KII-119 | Anne Støre | |||||||
Surface and particle analysis | Zetapotensial- og partikkelstørrelse-måler Beckman Coulter DelsaNano C | KII-223 | Magnus Følstad | |||||||
Glow Discharge Optical Emission Spectroscopy | GD-OES GD-profiler | KII-307 | Maria Stepanova | |||||||
Optical Microscope | Nikon SM2800 | KII-323 | ||||||||
Optical Microscope | Leica DM IRM | KII-323 | ||||||||
Optical microscope | Zeiss | |||||||||
Optical microscope | Wild Heerbrugg |
| ||||||||
IR instrumentSpectroscropy | Bruker IFS66V | KII-014 | ||||||||
UV-vis/NIR spektrofotometer + potensiostat | Photoelectrochemical station | Magnus Følstad | ||||||||
Massespektrometer | Pfeiffer Vacum Prisma Plus HiCube | Morten Tjelta | ||||||||
Viskositetsmåling | Haake Mars Modular Advanced Rheometer System | |||||||||
Viskositetsmåling | Haake Viskotester 550 Thermo Scientific | |||||||||
Optical microscope | Leica DMIL | Trygve L Schanche | ||||||||
Optical microscope | Olympus BH-2 | KII-032A | Stein Rørvik | |||||||
Optical microscope | Reichert MeF3A med Sony kamera | Stein Rørvik | ||||||||
Optical microscope | Olympus BX60 | Stein Rørvik | ||||||||
Peizoelektriske målinger | Aix PES Piezoelectric evaluation | |||||||||
Optical microscope | Leica EZ4 | |||||||||
Scanning electron microscope | Hitachi S-3400N | KII-036 |
...