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Type of equipmentName of equipmentLocationContact personLink to more information
Element AnalysisGD-MSE-208Chiara Modanese 
Texture AnalysisX-ray diffractometerA-347Torild Krogstad 
Optical microscopeWild HeerbruggA-443Trygve L. Schanche 
Optical microscopeLeica MEF4ME-514Trygve L. Schanche 
Optical microscopeReichert-Jung UnivarE-514Trygve L. Schanche 
Optical microscopeMakroskop Leitz M400E-508Trygve L. Schanche 
Optical microscopeLeitz MM6E-508Trygve L. Schanche 
Optical microscopeZeiss Axiovert 25E-508Trygve L. SchancheZeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508Trygve L. Schanche 
Optical microscopeLeitz 1AE-508Trygve L. Schanche 
Optical microscopeReichert MEF1E-508Trygve L. Schanche 
Optical microscopeLeitz Metallux 3E-514ATrygve L. SchancheLeitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGE-514ATrygve L. Schanche 
Videokamera til mikroskopLeica R3 elecrt.E-514A  
Optical microscopeLeitz AxioskopE-514ATrygve L. SchancheLeitz Axioskop
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Transmission Electron Microscopy

TEM with Gatan GIF system

JEOL TEM 2010

F-368Yingda Yu
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu 
Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Scanning probe microscope

AFM/STM

Agilent 5500

KII-003AMagnus Følstad

 

 

UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical stationKII-014Magnus Følstad

 

 

 Perkin Elmer Diffential scanning calorimeterKII-103Sverre Magnus Selback 
ovnHigh temperature oxygen flux furnaceKII-103Belma Talic 
Thermal analysisNETZSCH dilatometer 402EKII-103Ove Darell 
Thermal analysisNETZSCH dilatometer 402CKII-103Eli Beate Larsen 
Thermal analysisNETZSCH STA449 jupiterKII-103Eli Beate Larsen 
Thermal analysisNETZSCH STA449 jupiterKII-103Eli Beate Larsen 
ovnElectrical conductivity furnaceKII-103Belma Talic 
 NitrogentankKII-107Elin Albertsen 
 PSA Malvern 2000KII-107Jannicke Kvello 
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
 LECO, oksygen og nitrogenanalysatorKII-107Anne Støre 
 Accupyc 1330 PycnometerKII-107Julian Tolchard 
 D8 advance BrukerKII-113Julian Tolchard 
 Da Vinci 1 BrukerKII-113Julian Tolchard 
 Da Vinci 2 BrukerKII-113Julian Tolchard 
 A-unit X-ray diffractometerKII-113Julian Tolchard 
 D8 focus SiemensKII-113Julian Tolchard 
 Optisk dilatometer-Expert systemKII-119Anne Støre 
 LFA Microflash, termisk diffusivitetKII-119Anne Støre 
Zetapotensial- og partikkelstørrelse-målerBeckman Coulter DelsaNano CKII-223Magnus Følstad 
GD-OESGD-profilerKII-307Maria Stepanova 
Optical MicroscopeNikon SM2800KII-323  
Optical MicroscopeLeica DM IRMKII-323  
Optical microscopeZeiss   
Optical microscopeWild Heerbrugg  

 

 

IR instrumentBruker IFS66VKII-014  
UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical station Magnus Følstad 
MassespektrometerPfeiffer Vacum Prisma Plus HiCube Morten Tjelta 
ViskositetsmålingHaake Mars Modular Advanced Rheometer System   
ViskositetsmålingHaake Viskotester 550 Thermo Scientific   
Optical microscopeLeica DMIL Trygve L Schanche 
Optical microscopeOlympus BH-2KII-032AStein Rørvik 
Optical microscopeReichert MeF3A med Sony kamera Stein Rørvik 
Optical microscopeOlympus BX60 Stein Rørvik 
Peizoelektriske målingerAix PES Piezoelectric evaluation   
Optical microscopeLeica EZ4   
Scanning electron microscopeHitachi S-3400NKII-036 

Lv-sem Sem Sælandsvei (Hitachi S-3400N)

 


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