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The "A-unit"

Optical Microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Optical microscopeWild HeerbruggA-443Trygve L. Schanche 
Optical microscopeLeica MEF4ME-514Trygve L. Schanche   
Optical microscopeReichert-Jung UnivarE-514Trygve L. Schanche   
Optical microscopeMakroskop Leitz M400E-508Trygve L. Schanche   
Optical microscopeLeitz MM6E-508Trygve L. Schanche   
Optical microscopeZeiss Axiovert 25E-508Trygve L. Schanche  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508Trygve L. Schanche   
Optical microscopeLeitz 1AE-508Trygve L. Schanche   
Optical microscopeReichert MEF1E-508Trygve L. Schanche   
Optical microscopeLeitz Metallux 3E-514ATrygve L. Schanche  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGKII-014Trygve L. Schanche   
Videokamera til mikroskopLeica R3 elecrt.E-514ATrygve L. Schanche   
Optical microscopeLeitz AxioskopE-514ATrygve L. Schanche  Leitz Axioskop
Optical MicroscopeNikon SM2800KII-323Eli Beate Larsen 
Optical MicroscopeLeica DM IRMKII-323Eli Beate Larsen 
Optical microscopeZeissKII-003AMagnus Følstad 
Optical microscopeLeica DMILKII-022Trygve L. Schanche   
Optical microscopeOlympus BH-2KII-032AStein Rørvik (SINTEF) 
Optical microscopeReichert MeF3A med Sony kameraKII-032AStein Rørvik (SINTEF) 
Optical microscopeOlympus BX60KII-032AStein Rørvik (SINTEF) 
Optical microscopeLeica EZ4KII-034BSergey Khromov 
Optical microscopeWild HeerbruggKII-011  

Electron microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu

 

Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu 
Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu
Scanning electron microscopyHitachi S-3400NKII-036Sergey Khromov 

Scanning probe microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Scanning probe microscope

AFM/STM

Agilent 5500

KII-003AMagnus Følstad 

Transmission electron microscopy

Type of equipmentName of equipmentLocationContact personLink to more information
TEM with Gatan GIF systemJEOL TEM 2010F-368Yingda Yu 

Thermal analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Thermal analysisDTA/TGA Setaram SensisA-K032Sarina Bao (SINTEF) 
Thermal analysisElectrical conductivity furnaceKII-103Belma Talic 
Thermal analysisNETZSCH dilatometer 402C, themal analysisKII-103Eli Beate Larsen 
Thermal analysisNETZSCH STA449 jupiter, thermal analysis 1KII-103Eli Beate Larsen 
Thermal analysisNETZSCH STA449 jupiter, thermal analysis 2KII-103Eli Beate Larsen 
Thermal analysisNETZSCH dilatometer 402EKII-103Ove Darell (SINTEF) 
Thermal analysisPerkin Elmer Diffential scanning calorimeterKII-103Sverre Magnus Selbach 
Thermal analysisOptisk dilatometer-Expert systemKII-119Anne Støre (SINTEF) 
Thermal analysisLFA Microflash, termisk diffusivitetKII-119Anne Støre (SINTEF) 
Thermal analysisDilatometerKII-303Anne Støre (SINTEF) 

Spectroscopy

Type of equipmentName of equipmentLocationContact personLink to more information
SpectroscopyGD-OESKII-307Mariia Stepanova 
Spectroscopy Element AnalysisGD-MSE-208Chiara Modanese 
MassespectrometerPfeiffer Vacum Prisma Plus HiCubeKII-014Magnus Følstad 
UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical stationKII-014Magnus Følstad 

Surface and particle analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysisPSA Malvern 2000KII-107Elin Albertsen 
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
Surface and particle analysisPermeabilitetKII-303Anne Støre (SINTEF) 

XRD

Type of equipmentName of equipmentLocationContact personLink to more information

XRD

D8 Advance BrukerKII-113Kristin HøydalsvikThe "D8 Advance"
XRDDa Vinci 1 BrukerKII-113Kristin Høydalsvik 
XRDDa Vinci 2 BrukerKII-113Kristin Høydalsvik 
XRDA-unit X-ray diffractometer SiemensKII-113Kristin HøydalsvikThe "A-unit"
XRDD8 Focus BrukerKII-113Kristin HøydalsvikThe "D8 Focus"
Texture AnalysisX-ray diffractometerA-347Torild KrogstadXRD

Solar cell silicon characterisation

Type of equipmentName of equipmentLocationContact personLink to more information
Si - CharacterisationNicolet 6700 FT-IRM-104Chiara Modanese 
Si - CharacterisationµLPCD resistivty life time measurmentM-104Gaute Stokkan (SINTEF) 
Si - CharacterisationSiWaScanM-104Gaute Stokkan (SINTEF) 
Si - Characterisationmicro cracks characterisationM-104Kai Erik Ekstrøm 
Si - Characterisation Crystal deffect mesurmentPVSCAN 6000M-104Gaute Stokkan (SINTEF) 
Si - Characterisation Density ImagingCDI-CarrierM-104Gaute Stokkan (SINTEF) 

 

Electrical resistivity measurement

Type of equipmentName of equipmentLocationContact personLink to more information
Resistivity measurement (metals)SigmascopeE-508Trygve L. Schanche 

 

 

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