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Optical Microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Optical microscopeWild HeerbruggA-443Trygve L. Schanche 
Optical microscopeLeica MEF4ME-514Trygve L. Schanche   
Optical microscopeReichert-Jung UnivarE-514Trygve L. Schanche   
Optical microscopeMakroskop Leitz M400E-508Trygve L. Schanche   
Optical microscopeLeitz MM6E-508Trygve L. Schanche   
Optical microscopeZeiss Axiovert 25E-508Trygve L. Schanche  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508Trygve L. Schanche   
Optical microscopeLeitz 1AE-508Trygve L. Schanche   
Optical microscopeReichert MEF1E-508Trygve L. Schanche   
Optical microscopeLeitz Metallux 3E-514ATrygve L. Schanche  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGE-514ATrygve L. Schanche   
Videokamera til mikroskopLeica R3 elecrt.E-514ATrygve L. Schanche   
Optical microscopeLeitz AxioskopE-514ATrygve L. Schanche  Leitz Axioskop
Optical MicroscopeNikon SM2800KII-323  
Optical MicroscopeLeica DM IRMKII-323  
Optical microscopeZeiss   
Optical microscopeWild Heerbrugg  

 

 

Optical microscopeLeica DMIL Trygve L Schanche 
Optical microscopeOlympus BH-2KII-032AStein Rørvik 
Optical microscopeReichert MeF3A med Sony kamera Stein Rørvik 
Optical microscopeOlympus BX60 Stein Rørvik 
Optical microscopeLeica EZ4   

Electron microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu 
Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu

Scanning probe microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Scanning probe microscope

AFM/STM

Agilent 5500

KII-003AMagnus Følstad 

 


Thermal analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Thermal analysisPerkin Elmer Diffential scanning calorimeterKII-103Sverre Magnus Selback 
Thermal analysisHigh temperature oxygen flux furnaceKII-103Belma Talic 
Thermal analysisNETZSCH dilatometer 402EKII-103Ove Darell 
Thermal analysisNETZSCH dilatometer 402CKII-103Eli Beate Larsen 
Thermal analysisNETZSCH STA449 jupiterKII-103Eli Beate Larsen 
Thermal analysisElectrical conductivity furnaceKII-103Belma Talic 
Thermal analysisOptisk dilatometer-Expert systemKII-119Anne Støre 
Thermal analysisLFA Microflash, termisk diffusivitetKII-119Anne Støre 

 

Spectroscopy

 

Surface and particle analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysisXRD Texture AnalysisA-347Torild Krogstad 
Surface and particle analysisPSA Malvern 2000KII-107Jannicke Kvello 
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
Surface and particle analysis

Zetapotensial- og partikkelstørrelse-måler

Beckman Coulter DelsaNano C

KII-223Magnus Følstad 

XRD

Type of equipmentName of equipmentLocationContact personLink to more information

XRD

D8 advance BrukerKII-113Julian Tolchard 
XRDDa Vinci 1 BrukerKII-113Julian Tolchard 
XRDDa Vinci 2 BrukerKII-113Julian Tolchard 
XRDA-unit X-ray diffractometerKII-113Julian Tolchard 
XRDD8 focus SiemensKII-113Julian Tolchard 

Solar cell silicon characterisation

 


 

 

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