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Optical Microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Optical microscopeWild HeerbruggA-443Trygve L. SchancheWild Heerbrugg
Optical microscopeLeica MEF4ME-514Trygve L. Schanche  Leica MEF4M
Optical microscopeReichert-Jung UnivarE-514Trygve L. Schanche  Reitchert-Jung Univar
Optical microscopeMakroskop Leitz M400E-508Trygve L. Schanche  Makroskop Leitz M400
Optical microscopeLeitz MM6E-508Trygve L. Schanche  Leitz MM6
Optical microscopeZeiss Axiovert 25E-508Trygve L. Schanche  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508Trygve L. Schanche  Leitz metalloplan
Optical microscopeLeitz 1AE-508Trygve L. Schanche  Leitz 1A
Optical microscopeReichert MEF1E-508Trygve L. Schanche  Reitchert MEF1
Optical microscopeLeitz Metallux 3E-514ATrygve L. Schanche  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGE-514ATrygve L. Schanche  Video camera
Videokamera til mikroskopLeica R3 elecrt.E-514ATrygve L. Schanche  Video camera for microscope
Optical microscopeLeitz AxioskopE-514ATrygve L. Schanche  Leitz Axioskop
Optical MicroscopeNikon SM2800KII-323 Nikon SM2800
Optical MicroscopeLeica DM IRMKII-323  
Optical microscopeZeiss   
Optical microscopeWild Heerbrugg  

 

 

Optical microscopeLeica DMIL Trygve L SchancheLeica DMIL
Optical microscopeOlympus BH-2KII-032AStein Rørvik 
Optical microscopeReichert MeF3A med Sony kamera Stein Rørvik 
Optical microscopeOlympus BX60 Stein Rørvik 
Optical microscopeLeica EZ4   

Electron microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu 
Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu

Scanning probe microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Scanning probe microscope

AFM/STM

Agilent 5500

KII-003AMagnus Følstad

SPM Agilent 5500

 


Thermal analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Thermal analysisPerkin Elmer Diffential scanning calorimeterKII-103Sverre Magnus SelbackPerkin Elmer Diffential scanning calorimeter
Thermal analysisHigh temperature oxygen flux furnaceKII-103Belma TalicHigh temperature oxygen flux furnace
Thermal analysisNETZSCH dilatometer 402EKII-103Ove DarellNETZSCH Dilatometer 402E
Thermal analysisNETZSCH dilatometer 402CKII-103Eli Beate LarsenNETZSCH Dilatometer 402C
Thermal analysisNETZSCH STA449 jupiterKII-103Eli Beate LarsenNETZSCH STA449 Jupiter
Thermal analysisElectrical conductivity furnaceKII-103Belma TalicElectrical conductivity furnace
Thermal analysisOptisk dilatometer-Expert systemKII-119Anne StøreOptisk dilatometer-Expert system
Thermal analysisLFA Microflash, termisk diffusivitetKII-119Anne StøreLFA Microflash, thermal diffusivity

 

Spectroscopy

 

Surface and particle analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysisXRD Texture AnalysisA-347Torild KrogstadXRD Texture analysis
Surface and particle analysisPSA Malvern 2000KII-107Jannicke KvelloPSA Malvern 2000
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
Surface and particle analysis

Zetapotensial- og partikkelstørrelse-måler

Beckman Coulter DelsaNano C

KII-223Magnus FølstadBeckman Coulter DelsaNano C

XRD

Type of equipmentName of equipmentLocationContact personLink to more information

XRD

D8 advance BrukerKII-113Julian TolchardD8 Advance Bruker
XRDDa Vinci 1 BrukerKII-113Julian TolchardDa Vinci 1 Bruker
XRDDa Vinci 2 BrukerKII-113Julian TolchardDa Vinci 2 Bruker
XRDA-unit X-ray diffractometerKII-113Julian TolchardA-unit X-ray diffractometer
XRDD8 focus SiemensKII-113Julian TolchardD8 focus Siemens

Solar cell silicon characterisation

 


 

Type of equipmentName of equipmentLocationContact personLink to more information
Element AnalysisGD-MSE-208Chiara ModaneseGD-MS
Surface and particle analysisXRD Texture AnalysisA-347Torild KrogstadXRD Texture analysis
Optical microscopeWild HeerbruggA-443Trygve L. SchancheWild Heerbrugg
Optical microscopeLeica MEF4ME-514Trygve L. Schanche  Leica MEF4M
Optical microscopeReichert-Jung UnivarE-514Trygve L. Schanche  Reitchert-Jung Univar
Optical microscopeMakroskop Leitz M400E-508Trygve L. Schanche  Makroskop Leitz M400
Optical microscopeLeitz MM6E-508Trygve L. Schanche  Leitz MM6
Optical microscopeZeiss Axiovert 25E-508Trygve L. Schanche  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508Trygve L. Schanche  Leitz metalloplan
Optical microscopeLeitz 1AE-508Trygve L. Schanche  Leitz 1A
Optical microscopeReichert MEF1E-508Trygve L. Schanche  Reitchert MEF1
Optical microscopeLeitz Metallux 3E-514ATrygve L. Schanche  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGE-514ATrygve L. Schanche  Video camera
Videokamera til mikroskopLeica R3 elecrt.E-514ATrygve L. Schanche  Video camera for microscope
Optical microscopeLeitz AxioskopE-514ATrygve L. Schanche  Leitz Axioskop
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Transmission Electron Microscopy

TEM with Gatan GIF system

JEOL TEM 2010

F-368Yingda Yu
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu 
Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Scanning probe microscope

AFM/STM

Agilent 5500

KII-003AMagnus Følstad

SPM Agilent 5500

 

UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical stationKII-014Magnus Følstad

Photoelectrochemical station

Thermal analysisPerkin Elmer Diffential scanning calorimeterKII-103Sverre Magnus SelbackPerkin Elmer Diffential scanning calorimeter
Thermal analysisHigh temperature oxygen flux furnaceKII-103Belma TalicHigh temperature oxygen flux furnace
Thermal analysisNETZSCH dilatometer 402EKII-103Ove DarellNETZSCH Dilatometer 402E
Thermal analysisNETZSCH dilatometer 402CKII-103Eli Beate LarsenNETZSCH Dilatometer 402C
Thermal analysisNETZSCH STA449 jupiterKII-103Eli Beate LarsenNETZSCH STA449 Jupiter
Thermal analysisElectrical conductivity furnaceKII-103Belma TalicElectrical conductivity furnace
Surface and particle analysisPSA Malvern 2000KII-107Jannicke KvelloPSA Malvern 2000
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
LECOOxygen and nitrogen analysisKII-107Anne StøreLECO
PycnometerAccupyc 1330KII-107Julian TolchardAccupyc 1330

XRD

D8 advance BrukerKII-113Julian TolchardD8 Advance Bruker
XRDDa Vinci 1 BrukerKII-113Julian TolchardDa Vinci 1 Bruker
XRDDa Vinci 2 BrukerKII-113Julian TolchardDa Vinci 2 Bruker
XRDA-unit X-ray diffractometerKII-113Julian TolchardA-unit X-ray diffractometer
XRDD8 focus SiemensKII-113Julian TolchardD8 focus Siemens
Thermal analysisOptisk dilatometer-Expert systemKII-119Anne StøreOptisk dilatometer-Expert system
Thermal analysisLFA Microflash, termisk diffusivitetKII-119Anne StøreLFA Microflash, thermal diffusivity
Surface and particle analysis

Zetapotensial- og partikkelstørrelse-måler

Beckman Coulter DelsaNano C

KII-223Magnus FølstadBeckman Coulter DelsaNano C

Glow Discharge Optical Emission Spectroscopy

GD-OES GD-profilerKII-307Maria StepanovaGD-OES
Optical MicroscopeNikon SM2800KII-323 Nikon SM2800
Optical MicroscopeLeica DM IRMKII-323  
Optical microscopeZeiss   
Optical microscopeWild Heerbrugg  

 

 

IR Spectroscropy

Bruker IFS66V

KII-014  
UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical station Magnus Følstad 
MassespektrometerPfeiffer Vacum Prisma Plus HiCube Morten Tjelta 
ViskositetsmålingHaake Mars Modular Advanced Rheometer System   
ViskositetsmålingHaake Viskotester 550 Thermo Scientific   
Optical microscopeLeica DMIL Trygve L SchancheLeica DMIL
Optical microscopeOlympus BH-2KII-032AStein Rørvik 
Optical microscopeReichert MeF3A med Sony kamera Stein Rørvik 
Optical microscopeOlympus BX60 Stein Rørvik 
Peizoelektriske målingerAix PES Piezoelectric evaluation   
Optical microscopeLeica EZ4   
Scanning electron microscopeHitachi S-3400NKII-036 

Lv-sem Sem Sælandsvei (Hitachi S-3400N)


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