Page tree
Skip to end of metadata
Go to start of metadata

Main application: bulk elemental analysis with part-per-billion sensitivity


•Recommended for: metal alloys, composite materials, silicon wafers, solar cells

•Also possible: depth profiling of coatings, diffusion layers (only few elements in one measurement)


Before you begin

  • Contact equipment responsible: sergey.khromov@ntnu.no
  • Equipment may not be used without training. 
  • No labels