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Type of equipment | Name of equipment | Location | Contact person | Link to more information | ||||||
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Electron Micro Probe Analyzer | FE-EPMA wirh JEOL WDS system JEOL JXA 8500 | F-373 | Morten Raanes |
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Scanning probe microscope | AFM/STM Agilent 5500 | KII-003A | Magnus Følstad |
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Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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XRD | D8 advance Bruker | KII-113 | Julian TolchardKristin Høydalsvik | |
XRD | Da Vinci 1 Bruker | KII-113 | Julian TolchardKristin Høydalsvik | |
XRD | Da Vinci 2 Bruker | KII-113 | Julian TolchardKristin Høydalsvik | |
XRD | A-unit X-ray diffractometer | KII-113 | Julian TolchardKristin Høydalsvik | |
XRD | D8 focus Siemens | KII-113 | Julian TolchardKristin Høydalsvik |
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