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| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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| Surface and particle analysis | 3Flex 3500 | KII-107 | Elin AlbertsenMartin Oppegård | BET |
| Surface and particle analysis | TRISTAR 3000 surface area and porosity analyzer | KII-107 | Elin AlbertsenMartin Oppegård | BET |
| Surface and particle analysis | Permeabilitet | KII-303 | Anne Støre (SINTEF) | |
| Surface analyzer | Drop Shape Analyzer - DSA100 | KII-321 | Johannes Ofstad | Description |
| Laser scattering particle size analyzer | Horiba LA-960 Partica | KII-107 | Anita Britt OlsenMartin Oppegård | Description |
| Micro Scratch Tester | ST Instruments B A | KII-321 | Johannes Ofstad | |
| Density and volume analysis | Pycnometer | KII-107 | Elin AlbertsenMartin Oppegård | AccuPyc II 1340 |
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| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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| XRD | Routine Powder Diffractometer (DaVinci1) | KII-113 | Contact personElvia Anabela Panduro | Routine powder XRD |
| XRD | Powder diffractometer (D8 Focus) | KII-113 | Contact personElvia Anabela Panduro | 9-pos Powder XRD |
| XRD | Thin-film Diffractometer (D8 Discover) | KII-113 | Contact personElvia Anabela Panduro | D8 Discover |
| XRD | Multipurpose Powder X-ray diffractometer (DaVinci2) | KII-113 | Contact personElvia Anabela Panduro | Multipurpose XRD |
| XRD | Non-ambient X-ray diffractometer (D8 Advance) | KII-113 | Contact personElvia Anabela Panduro | Non-ambient XRD |
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Inductively coupled plasma mass spectrometry (ICP-MS)
| Type of equipment | Name of equipment | Location | Contact person | Link to more information |
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| ICP-MS | Perkin Elmer NexION 5000 | KII-321 |
Electrical resistivity measurement
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