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Optical

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Optical Microscopes

 

 

Microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Element AnalysisGD-MSE-208Chiara ModaneseGD-MSSurface and particle analysisXRD Texture AnalysisA-347Torild KrogstadXRD Texture analysis
Optical microscopeWild HeerbruggA-443Trygve L. Schanche
Wild Heerbrugg
 
Optical microscopeLeica MEF4ME-514Trygve L. Schanche   
 
Leica MEF4M
Optical microscopeReichert-Jung UnivarE-514Trygve L. Schanche   
 
Reitchert-Jung Univar
Optical microscopeMakroskop Leitz M400E-508Trygve L. Schanche   
 
Makroskop Leitz M400
Optical microscopeLeitz MM6E-508Trygve L. Schanche   
 
Leitz MM6
Optical microscopeZeiss Axiovert 25E-508Trygve L. Schanche
  
  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508Trygve L. Schanche   
 
Leitz metalloplan
Optical microscopeLeitz 1AE-508Trygve L. Schanche   
 
Leitz 1A
Optical microscopeReichert MEF1E-508Trygve L. Schanche   
 
Reitchert MEF1
Optical microscopeLeitz Metallux 3E-514ATrygve L. Schanche
  
  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EG
E
KII-
514A
014Trygve L. Schanche   
 
Video camera
Videokamera til mikroskopLeica R3 elecrt.E-514ATrygve L. Schanche   
 
Video camera for microscope
Optical microscopeLeitz AxioskopE-514ATrygve L. Schanche
  
  Leitz Axioskop
Optical MicroscopeNikon SM2800KII-323Eli Beate Larsen 
Optical MicroscopeLeica DM IRMKII-323Eli Beate Larsen 
Optical microscopeZeissKII-003A Magnus B. Følstad 
Optical microscopeLeica DMILKII-022Kara Poon 
Optical microscopeOlympus BH-2KII-032AStein Rørvik (SINTEF) 
Optical microscopeReichert MeF3A med Sony kameraKII-032AStein Rørvik (SINTEF) 
Optical microscopeOlympus BX60KII-032AStein Rørvik (SINTEF) 
Optical microscopeLeica EZ4KII-034BSergey Khromov 
Optical microscopeWild HeerbruggKII-011  
Optical microscope 3DAlicona Infinite FocusKII-032AKara Poon 

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Electron microscope
Electron microscope

Electron microscope

Info

More information on SEM - TEM


Type of equipmentName of equipmentLocationContact personLink to more information
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu

Link in New Window
linkTextHitachi SU6600 FEG SEM
hrefhttp://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg

 

Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Link in New Window
linkTextFe-sem (Zeiss Ultra 55 LE)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Link in New Window
linkTextSEM A (JSM 840)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf
Transmission Electron Microscopy

TEM with Gatan GIF system

JEOL TEM 2010

F-368Yingda Yu
Link in New Window
linkTextTEM (JEOL, JEM-2010)
hrefhttps://www.ntnu.no/wiki/download/attachments/67474571/TEMinfo.pdf?version=1&modificationDate=1409311611000&api=v2
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu 
Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Link in New Window
linkTextEDS, EDAX Gernesis
hrefhttp://edax.com/
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu
Link in New Window
linkTextLV-Fe-SEM (ZeissSupra 55 VP)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf
Scanning electron microscopyHitachi S-3400NKII-036Sergey Khromov 

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Scanning probe microscope
Scanning probe microscope

Scanning probe microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Link in New Window
linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf
Scanning probe microscopeAgilent 5500 AFM/
STM
SPM microscope

Agilent 5500

KII-003AMagnus B. Følstad

SPM Agilent 5500

 

UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical stationKII-014Magnus Følstad

Photoelectrochemical station

Thermal analysisPerkin Elmer Diffential scanning calorimeterKII-103Sverre Magnus SelbackPerkin Elmer Diffential scanning calorimeterThermal analysisHigh temperature oxygen flux
About the instrument

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TEM
TEM

Transmission electron microscopy

Info

More information on SEM - TEM


Type of equipmentName of equipmentLocationContact personLink to more information
TEM with Gatan GIF systemJEOL TEM 2010F-368Yingda Yu 

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Thermal analysis
Thermal analysis

Thermal analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Thermal analysisDTA/TGA Setaram SensisA-K032Sarina Bao (SINTEF) 
Thermal analysisElectrical conductivity furnaceKII-103
Belma TalicHigh temperature oxygen flux furnace
Pei Na Kui  
Thermal analysisNETZSCH dilatometer
402E
402C, themal analysisKII-103
Ove Darell
Babak Khalaghi
NETZSCH
Dilatometer
402E
Thermal analysisNETZSCH
dilatometer 402CNETZSCH Dilatometer 402C
STA F3 449 Jupiter (Hugin)KII-103
Eli Beate Larsen
Babak KhalaghiSimultaneous Thermal Analysis
Thermal analysisNETZSCH
STA449 jupiterNETZSCH STA449 Jupiter
STA C 449 Jupiter, (Munin)KII-103
Eli Beate Larsen
Babak KhalaghiSimultaneous Thermal Analysis combined with mass spectrometry
Thermal analysis
Electrical conductivity furnace
LINSEIS STA PT 1600, (Linseis)KII-103
Belma TalicElectrical conductivity furnaceSurface and particle analysisPSA Malvern 2000
Babak KhalaghiSimultaneous Thermal Analysis
Thermal analysisNETZSCH dilatometer 402EKII-
107Jannicke KvelloPSA Malvern 2000Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBETLECOOxygen and nitrogen analysisKII-107Anne StøreLECOPycnometerAccupyc 1330KII-107Julian TolchardAccupyc 1330

XRD

D8 advance BrukerKII-113Julian TolchardD8 Advance BrukerXRDDa Vinci 1 BrukerKII-113Julian TolchardDa Vinci 1 BrukerXRDDa Vinci 2 BrukerKII-113Julian TolchardDa Vinci 2 BrukerXRDA-unit X-ray diffractometerKII-113Julian TolchardA-unit X-ray diffractometerXRDD8 focus SiemensKII-113Julian TolchardD8 focus SiemensThermal analysisOptisk dilatometer-Expert systemKII-119Anne StøreOptisk dilatometer-Expert systemThermal analysisLFA Microflash, termisk diffusivitetKII-119Anne StøreLFA Microflash, thermal diffusivitySurface and particle analysis

Zetapotensial- og partikkelstørrelse-måler

103Ove Darell (SINTEF) 
Thermal analysisNETZSCH DSC 214 Polyma KII-103Babak KhalaghiDSC 214 Polyma
Thermal analysisOptisk dilatometer-Expert systemKII-103Anne Støre (SINTEF) 
Thermal analysisLFA Microflash, termisk diffusivitetKII-103Anne Støre (SINTEF) 
Thermal analysisDilatometerKII-303Anne Støre (SINTEF) 

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Spectroscopy
Spectroscopy

Spectroscopy

Type of equipmentName of equipmentLocationContact personLink to more information
SpectroscopyGD-OESKII-307Mariia Stepanova 
Spectroscopy Element AnalysisGD-MSE-208Chiara Modanese 
Mass spectrometer + potensiostatDifferential Electrochemical Mass Spectrometry (DEMS) stationKII-323Magnus B. Følstad 
UV-vis/NIR spectrophotometer + potensiostatPhotoelectrochemical stationKII-001Magnus B. Følstad 
FTIR spectrometerBruker Vertex 80vKII-323

 

Raman microscopeWITec alpha300 RKII-323 

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Surface and particle analysis
Surface and particle analysis

Surface and particle analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysis

3Flex 3500

KII-107Elin AlbertsenBET
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
Surface and particle analysisPermeabilitetKII-303Anne Støre (SINTEF)

 

Zetapotential and particle size analyzerBeckman Coulter DelsaNano CKII-223Magnus B. Følstad
Beckman Coulter DelsaNano C

Glow Discharge Optical Emission Spectroscopy

GD-OES GD-profiler
Description, terms of use & user manual
Surface analyzerDrop Shape Analyzer - DSA100KII-
307
321
Maria StepanovaGD-OESOptical MicroscopeNikon SM2800
Anita StorsveDescription
Laser scattering particle size analyzerHoriba LA-960 ParticaKII-
323
107
 
Eva Rise
Nikon SM2800Optical MicroscopeLeica DM IRM
Description
Micro Scratch TesterST Instruments B AKII-
323
321
 
Anita Storsve 
Optical microscopeZeiss   Optical microscopeWild Heerbrugg  

 

 

IR Spectroscropy

Bruker IFS66V

KII-014  UV-vis/NIR spektrofotometer + potensiostatPhotoelectrochemical station Magnus Følstad MassespektrometerPfeiffer Vacum Prisma Plus HiCube Morten Tjelta ViskositetsmålingHaake Mars Modular Advanced Rheometer System   ViskositetsmålingHaake Viskotester 550 Thermo Scientific   Optical microscopeLeica DMIL Trygve L SchancheLeica DMILOptical microscopeOlympus BH-2KII-032AStein Rørvik Optical microscopeReichert MeF3A med Sony kamera Stein Rørvik Optical microscopeOlympus BX60 Stein Rørvik Peizoelektriske målingerAix PES Piezoelectric evaluation   Optical microscopeLeica EZ4   Scanning electron microscopeHitachi S-3400NKII-036 

Lv-sem Sem Sælandsvei (Hitachi S-3400N)

 

Density and volume analysisPycnometerKII-107Elin AlbertsenAccuPyc II 1340

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XRD
XRD

XRD

Info

More information about the XRD lab


Type of equipmentName of equipmentLocationContact personLink to more information
XRDRoutine Powder Diffractometer (DaVinci1)KII-113Contact personRoutine powder XRD
XRDPowder diffractometer (D8 Focus)KII-113Contact person9-pos Powder XRD
XRDSiemens D5005 with monochromator (A-unit)KII-113Contact personSiemens D5005
XRDMultipurpose Powder X-ray diffractometer (DaVinci2)KII-113Contact personMultipurpose XRD
XRDNon-ambient X-ray diffractometer (D8 Advance)KII-113Contact personNon-ambient XRD
Texture AnalysisX-ray diffractometerA-347Håkon Wiik ÅnesXRD

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Solar cell silicon characterisation
Solar cell silicon characterisation

Solar cell silicon characterisation

Type of equipmentName of equipmentLocationContact personLink to more information
Si - CharacterisationNicolet 6700 FT-IRM-104Chiara Modanese 
Si - CharacterisationµLPCD resistivty life time measurmentM-104Gaute Stokkan (SINTEF) 
Si - CharacterisationSiWaScanM-104Gaute Stokkan (SINTEF) 
Si - Characterisationmicro cracks characterisationM-104Kai Erik Ekstrøm 
Si - Characterisation Crystal deffect mesurmentPVSCAN 6000M-104Gaute Stokkan (SINTEF) 
Si - Characterisation Density ImagingCDI-CarrierM-104Gaute Stokkan (SINTEF) 

 

Electrical resistivity measurement

Type of equipmentName of equipmentLocationContact personLink to more information
Resistivity measurement (metals)SigmascopeE-508Trygve L. Schanche