Versions Compared

Key

  • This line was added.
  • This line was removed.
  • Formatting was changed.

 

Optical Microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Optical microscopeWild HeerbruggA-443Trygve L. Schanche 
Optical microscopeLeica MEF4ME-514Trygve L. Schanche   
Optical microscopeReichert-Jung UnivarE-514Trygve L. Schanche   
Optical microscopeMakroskop Leitz M400E-508Trygve L. Schanche   
Optical microscopeLeitz MM6E-508Trygve L. Schanche   
Optical microscopeZeiss Axiovert 25E-508Trygve L. Schanche  Zeiss Axiovert 25
Optical microscopeLeitz metalloplanE-508Trygve L. Schanche   
Optical microscopeLeitz 1AE-508Trygve L. Schanche   
Optical microscopeReichert MEF1E-508Trygve L. Schanche   
Optical microscopeLeitz Metallux 3E-514ATrygve L. Schanche  Leitz Metallux 3
Videokamera (2 stk)JVC TK-S310 EGKII-014Trygve L. Schanche   
Videokamera til mikroskopLeica R3 elecrt.E-514ATrygve L. Schanche   
Optical microscopeLeitz AxioskopE-514ATrygve L. Schanche  Leitz Axioskop
Optical MicroscopeNikon SM2800KII-323Eli Beate Larsen 
Optical MicroscopeLeica DM IRMKII-323Eli Beate Larsen 
Optical microscopeZeissKII-003A Magnus B. Følstad 
Optical microscopeLeica DMILKII-022Kara Poon 
Optical microscopeOlympus BH-2KII-032AStein Rørvik (SINTEF) 
Optical microscopeReichert MeF3A med Sony kameraKII-032AStein Rørvik (SINTEF) 
Optical microscopeOlympus BX60KII-032AStein Rørvik (SINTEF) 
Optical microscopeLeica EZ4KII-034BSergey Khromov 
Optical microscopeWild HeerbruggKII-011  
Optical microscope 3DAlicona Infinite FocusKII-
022
032AKara Poon 

Anchor
Electron microscope
Electron microscope

...

Info

More information on SEM - TEM

EMlab


Type of equipmentName of equipmentLocationContact personLink to more information
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu

Link in New Window
linkTextHitachi SU6600 FEG SEM
hrefhttp://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg

 

Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Link in New Window
linkTextFe-sem (Zeiss Ultra 55 LE)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Link in New Window
linkTextSEM A (JSM 840)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu 
Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Link in New Window
linkTextEDS, EDAX Gernesis
hrefhttp://edax.com/
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu
Link in New Window
linkTextLV-Fe-SEM (ZeissSupra 55 VP)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf
Scanning electron microscopyHitachi S-3400NKII-036Sergey Khromov 

Anchor
Scanning probe microscope
Scanning probe microscope

Scanning probe microscope

Type of equipmentName of equipmentLocationContact personLink to more information
Electron Micro Probe Analyzer

FE-EPMA wirh JEOL WDS system

JEOL JXA 8500

F-373Morten Raanes
Link in New Window
linkTextJEOL JXA-8500F Electron Probe Micro analyzer (EPMA)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoEPMA.pdf
Scanning probe microscopeAgilent 5500 AFM/SPM microscopeKII-003AMagnus B. FølstadAbout the instrument

Anchor
TEM
TEM

Transmission electron microscopy

Info

More information on SEM - TEM

EMlab


Type of equipmentName of equipmentLocationContact personLink to more information
TEM with Gatan GIF systemJEOL TEM 2010F-368Yingda Yu 

Anchor
Thermal analysis
Thermal analysis

Thermal analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Thermal analysisDTA/TGA Setaram SensisA-K032Sarina Bao (SINTEF) 
Thermal analysisElectrical conductivity furnaceKII-103Pei Na Kui  
Thermal analysisNETZSCH dilatometer 402C, themal analysisKII-103
Babak Khalaghi
Pei Na KuiDilatometer
Thermal analysisNETZSCH
STA449 jupiter, thermal analysis 1
STA F3 449 Jupiter (Hugin)KII-103
Babak Khalaghi
Pei Na KuiSimultaneous Thermal Analysis
Thermal analysisNETZSCH
STA449 jupiter, thermal analysis 2
STA C 449 Jupiter, (Munin)KII-103
Babak Khalaghi
Pei Na KuiSimultaneous Thermal Analysis combined with mass spectrometry
Thermal analysisLINSEIS STA PT 1600, (Linseis)KII-103Pei Na KuiSimultaneous Thermal Analysis
Thermal analysisNETZSCH dilatometer 402EKII-103Ove Darell (SINTEF) 
Thermal analysisNETZSCH DSC 214 Polyma KII-103
Babak Khalaghi
Pei Na KuiDSC 214 Polyma
Thermal analysisOptisk dilatometer-Expert systemKII-103Anne Støre (SINTEF) 
Thermal analysisLFA Microflash, termisk diffusivitetKII-103Anne Støre (SINTEF) 
Thermal analysisDilatometerKII-303Anne Støre (SINTEF) 

Anchor
Spectroscopy
Spectroscopy

Spectroscopy

Type of equipmentName of equipmentLocationContact personLink to more information
SpectroscopyGD-OESKII-307Mariia Stepanova 
Spectroscopy Element AnalysisGD-MSE-208Chiara Modanese 
Mass spectrometer + potensiostatDifferential Electrochemical Mass Spectrometry (DEMS) stationKII-323Magnus B. Følstad 
UV-vis/NIR spectrophotometer + potensiostatPhotoelectrochemical stationKII-001Magnus B. Følstad 
FTIR spectrometerBruker Vertex 80vKII-323
Magnus B. Følstad

 

Raman microscopeWITec alpha300 RKII-323
Magnus B. Følstad
 

Anchor
Surface and particle analysis
Surface and particle analysis

Surface and particle analysis

Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysis
PSA Malvern 2000

3Flex 3500

KII-107Elin Albertsen
 
BET
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
Surface and particle analysisPermeabilitetKII-303Anne Støre (SINTEF)

 

Zetapotential and particle size analyzerBeckman Coulter DelsaNano CKII-223Magnus B. FølstadDescription, terms of use & user manual
Surface analyzerDrop Shape Analyzer - DSA100KII-321
Anita Storsve
Johannes OfstadDescription
Laser scattering particle size analyzerHoriba LA-960 ParticaKII-107
Johannes Ofstad
Eva RiseDescription
Micro Scratch TesterST Instruments B AKII-321
Anita Storsve
Johannes Ofstad 
Density and volume analysisPycnometerKII-107Elin AlbertsenAccuPyc II 1340

Anchor
XRD
XRD

XRD

Info

More information about the XRD lab


Type of equipmentName of equipmentLocationContact personLink to more information
XRDRoutine Powder Diffractometer (DaVinci1)KII-113Contact personRoutine powder XRD
XRDPowder diffractometer (D8 Focus)KII-113Contact person9-pos Powder XRD
XRDSiemens D5005 with monochromator (A-unit)KII-113Contact personSiemens D5005
XRDMultipurpose Powder X-ray diffractometer (DaVinci2)KII-113Contact personMultipurpose XRD
XRDNon-ambient X-ray diffractometer (D8 Advance)KII-113Contact personNon-ambient XRD
Texture AnalysisX-ray diffractometerA-347Håkon Wiik ÅnesMacrotexture XRD

Anchor
Solar cell silicon characterisation
Solar cell silicon characterisation

Solar cell silicon characterisation

Type of equipmentName of equipmentLocationContact personLink to more information
Si - CharacterisationNicolet 6700 FT-IRM-104Chiara Modanese 
Si - CharacterisationµLPCD resistivty life time measurmentM-104Gaute Stokkan (SINTEF) 
Si - CharacterisationSiWaScanM-104Gaute Stokkan (SINTEF) 
Si - Characterisationmicro cracks characterisationM-104Kai Erik Ekstrøm 
Si - Characterisation Crystal deffect mesurmentPVSCAN 6000M-104Gaute Stokkan (SINTEF) 
Si - Characterisation Density ImagingCDI-CarrierM-104Gaute Stokkan (SINTEF) 

 

Electrical resistivity measurement

Type of equipmentName of equipmentLocationContact personLink to more information
Resistivity measurement (metals)SigmascopeE-508Trygve L. Schanche