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Info

More information on SEM - TEM

EMlab


Type of equipmentName of equipmentLocationContact personLink to more information
Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Hitachi SU6600

F-362Yingda Yu

Link in New Window
linkTextHitachi SU6600 FEG SEM
hrefhttp://www.material.ntnu.no/lab/material/equipment/HitachiFEG.jpg

 

Scanning Electron Microscopy

FE-SEM with Bruker EDS/NORDIF EBSD system

Zeiss Ultra 55

F-362Yingda Yu
Link in New Window
linkTextFe-sem (Zeiss Ultra 55 LE)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ULTRA_Technical.pdf
Scanning Electron Microscopy

SEM with Nordif EBSD system

JEOL JSM 840A

F-362Yingda Yu
Link in New Window
linkTextSEM A (JSM 840)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoSEM_A.pdf
Scanning Electron Microscopy

SEM with Gatan CL system

JEOL JSM 840

F-369Yingda Yu 
Scanning Electron Microscopy

SEM with JEOL EDS system

JEOL JSM 6010LA

F-369Yingda Yu
Link in New Window
linkTextEDS, EDAX Gernesis
hrefhttp://edax.com/
Scanning Electron Microscopy

FE-SEM wirh EDAX EDS system

Zeiss Supra 55VP

F-369Yingda Yu
Link in New Window
linkTextLV-Fe-SEM (ZeissSupra 55 VP)
hrefhttp://www.material.ntnu.no/lab/material/equipment/ProdInfoFE-SEM.pdf
Scanning electron microscopyHitachi S-3400NKII-036Sergey Khromov 

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Info

More information on SEM - TEM

EMlab


Type of equipmentName of equipmentLocationContact personLink to more information
TEM with Gatan GIF systemJEOL TEM 2010F-368Yingda Yu 

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Type of equipmentName of equipmentLocationContact personLink to more information
Thermal analysisDTA/TGA Setaram SensisA-K032Sarina Bao (SINTEF) 
Thermal analysisElectrical conductivity furnaceKII-103Pei Na Kui  
Thermal analysisNETZSCH dilatometer 402C, themal analysisKII-103Babak KhalaghiPei Na KuiDilatometer
Thermal analysisNETZSCH STA F3 449 Jupiter (Hugin)KII-103Babak KhalaghiPei Na KuiSimultaneous Thermal Analysis
Thermal analysisNETZSCH STA C 449 Jupiter, (Munin)KII-103Babak KhalaghiPei Na KuiSimultaneous Thermal Analysis combined with mass spectrometry
Thermal analysisLINSEIS STA PT 1600, (Linseis)KII-103Babak KhalaghiPei Na KuiSimultaneous Thermal Analysis
Thermal analysisNETZSCH dilatometer 402EKII-103Ove Darell (SINTEF) 
Thermal analysisNETZSCH DSC 214 Polyma KII-103Babak KhalaghiPei Na KuiDSC 214 Polyma
Thermal analysisOptisk dilatometer-Expert systemKII-103Anne Støre (SINTEF) 
Thermal analysisLFA Microflash, termisk diffusivitetKII-103Anne Støre (SINTEF) 
Thermal analysisDilatometerKII-303Anne Støre (SINTEF) 

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Type of equipmentName of equipmentLocationContact personLink to more information
Surface and particle analysis

3Flex 3500

KII-107Elin AlbertsenBET
Surface and particle analysisTRISTAR 3000 surface area and porosity analyzer KII-107Elin AlbertsenBET
Surface and particle analysisPermeabilitetKII-303Anne Støre (SINTEF)

 

Zetapotential and particle size analyzerBeckman Coulter DelsaNano CKII-223Magnus B. FølstadDescription, terms of use & user manual
Surface analyzerDrop Shape Analyzer - DSA100KII-321Anita StorsveJohannes OfstadDescription
Laser scattering particle size analyzerHoriba LA-960 ParticaKII-107Eva RiseDescription
Micro Scratch TesterST Instruments B AKII-321Anita StorsveJohannes Ofstad 
Density and volume analysisPycnometerKII-107Elin AlbertsenAccuPyc II 1340

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XRD
XRD

XRD

Info

More information about the XRD lab

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Type of equipmentName of equipmentLocationContact personLink to more information
XRDRoutine Powder Diffractometer (DaVinci1)KII-113Contact personRoutine powder XRD
XRDPowder diffractometer (D8 Focus)KII-113Contact person9-pos Powder XRD
XRDSiemens D5005 with monochromator (A-unit)KII-113Contact personSiemens D5005
XRDMultipurpose Powder X-ray diffractometer (DaVinci2)KII-113Contact personMultipurpose XRD
XRDNon-ambient X-ray diffractometer (D8 Advance)KII-113Contact personNon-ambient XRD
Texture AnalysisX-ray diffractometerA-347Håkon Wiik ÅnesMacrotexture XRD

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Solar cell silicon characterisation
Solar cell silicon characterisation

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