Skip to end of metadata
Go to start of metadata


Siemens D5000 X-ray Diffractometer

The instrument is used to measure crystallographic texture.

Sample preparation

Guide (PDF): Sample Preparation for Texture Measurements in Siemens Diffractometer 5000.

Analyse pole figures in MTEX

Guide (PDF): Analyse TexEval Pole Figure Data in MTEX



Location: A 347

Contact person: Håkon Wiik Ånes / / 930 26 987



  • No labels