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XRD

Siemens D5000 X-ray Diffractometer

The instrument is used to measure crystallographic texture.

Sample preparation

Guide (PDF): Sample Preparation for Texture Measurements in Siemens Diffractometer 5000.

Analyse pole figures in MTEX

Guide (PDF): Analyse TexEval Pole Figure Data in MTEX

Scripts: https://github.com/hakonanes/texeval2mtex

 

Location: A 347

Contact person: Håkon Wiik Ånes / hakon.w.anes@ntnu.no / 930 26 987

 

 

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